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InfrastructureAFM


Atomic Force Microscope

AFM system

Description

  • Digital Instruments NanoScope E Microscope in contact mode, connected to a measure unit LFM-3/269.
  • Morphologic characterization of the thin layers’ surface.
  • Si3Ni4 standard cantilevers with elastic constant between 0.18 and 0.58 Nm-1.
  • Contact strength less than 10 nN.


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Page last modified on July 30, 2013, at 09:02 PM.