Atomic force microscopy AFM & STM
Model NanoScope E (Digital Instruments). Used for the surface characterization of thin films and of nanostructures patterned on them.
- Modes: Contact AFM, STM, picoindentation.
- Scanner: AS-130 V (J).
- Scan Size: 125 µm x 125 µm (horizontal axes), 5 µm (vertical axis)
- Si3Ni4 standard cantilevers with elastic constant between 0.18 and 0.58 Nm-1
- Contact strength less than 10 nN.
- Resolution: ~0.3 nm