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Atomic force microscopy AFM & STM

atomic force microcope AFM

Model NanoScope E (Digital Instruments). Used for the surface characterization of thin films and of nanostructures patterned on them.

Main specifications:

  • Modes: Contact AFM, STM, picoindentation.
  • Scanner: AS-130 V (J).
  • Scan Size: 125 µm x 125 µm (horizontal axes), 5 µm (vertical axis)
  • Si3Ni4 standard cantilevers with elastic constant between 0.18 and 0.58 Nm-1
  • Contact strength less than 10 nN.
  • Resolution: ~0.3 nm


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Page last modified on February 20, 2018, at 08:59 PM.