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X-ray diffractometer

X-ray diffractometer

Model Miniflex II (Rigaku). Used for the characterization of the composition and crystal structure of bulk samples and thin films.

Main specifications:

  • X-ray generator:
    • target: Cu
    • max. power: voltage 30 kV; current 10 mA
  • Goniometer (vertical):
    • range: -3 to 145º
    • speed: 0.01 to 100º/min
    • step: 0.005 degrees
  • Detector: NaI scintillator
  • Automated control
  • Analysis software: PDXL


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Page last modified on February 20, 2018, at 08:43 PM.