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Scanning Electron Microscope

SEM system

Description

  • It gives information about the shapes, texture and chemical composition of the constituents of the sample.

Technical features

  • Resolution:
    • 3.0 nm for 30 KV (SE and W).
    • 2.0 nm for 30 KV (SE and LaB6).
  • Accelerator voltage:
    • 0.2 to 30 KV.
  • Magnification:
    • 5 at 106x
  • Vision field:
    • 6 mm (AWD).
  • Camera:
    • 365 mm (diameter) x 255 mm (h).
  • Sample holder movement:
    • X=100 mm (+50 mm, -50 mm)
    • Y= 125 mm (+65 mm, -60 mm)
    • Z = 55 mm T = 0o - 90o
    • R = 360o
  • Position controlled by computer and joystick.
  • Images processing:
    • Resolution up to 3072 x 2304 pixel.
  • Screen images:
    • 1024 x 768 pixel.
  • Control system:
    • SmartSEM with Windows XP.



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Page last modified on September 03, 2013, at 06:22 PM.